Papers (author)
C.L. Luengo Hendriks, M. van Ginkel, P.W. Verbeek and L.J. van Vliet
The generalized Radon transform: sampling,
accuracy and memory considerations
Pattern Recognition, 38(12), pp. 2494-2505, 2005
J. Dijk, M. van Ginkel, R.J. van Asselt, L.J. van Vliet, and P.W. Verbeek
A new sharpness measure based on Gaussian
lines and edges
N. Petkov, M.A. Westenberg (eds.), Proceedings of the 10th International
Conference on Computer Analysis of Images and Patterns (Groningen,
the Netherlands, August 25-27), Lecture Notes in Computer Science, vol. 2756,
Springer Verlag, pp. 149-156, 2003.
M. van Ginkel, M.A. Kraaijveld, L.J. van Vliet, E.P. Reding,
P.W. Verbeek and H.J. Lammers
Robust Curve Detection Using a Radon
Transform in Orientation Space
J. Bigün and T. Gustavsson, editors. Proceedings of the 13th Scandinavian
Conference on Image Analysis, pp. 125-132, June 29-July 2 2003.
M. van Ginkel, L.J. van Vliet and P.W. Verbeek
Robust Curvature Estimation by Finding Optimal Circular Segments
in Orientation Space
L.J. van Vliet, J.W.K. Heijnsdijk, T. Kielmann and P.M.W. Knijnenburg, editors.
ASCI2000, Proc. 6th Annual Conference of the Advanced School for Computing and
Imaging (Lommel, Belgium), pp. 299-306, June 14-16 2000.
M. van Ginkel, J. van de Weijer, P.W. Verbeek and L.J. van Vliet
Curvature Estimation from Orientation Fields
B.K. Ersboll and P. Johansen, editors. SCIA'99, Proc. 11th Scandinavian
Conference on Image Analysis (Kangerlussuaq, Greenland), pp. 545-551, June 7-11
1999.
G.M.P. van Kempen, N. van den Brink, L.J. van Vliet, M. van Ginkel
and P.W. Verbeek
The Application of a Local Dimensionality Estimator to
the Analysis of 3D Microscopic Network Structures
SCIA'99, Proc. 11th Scandinavian Conference on Image Analysis (Kangerlussuaq,
Greenland), pp. 447-455, June 7-11 1999.
M. van Ginkel, P.W. Verbeek and L.J. van Vliet
Curvature Estimation for Overlapping Curved Patterns
using Orientation Space
B. ter Haar Romeny, D.H.J. Epema and J.F.M. Tonino, editors. Proceedings of the
third annual conference of the Advanced School for Computing and Imaging
(Lommel, Belgium), pp. 173-178, June 9-11 1998.
M. van Ginkel, P.W. Verbeek and L.J. van Vliet
Orientation Selectivity for Orientation Estimation
Proceedings of the 10th Scandinavian Conference on Image Analysis
(Lappeenranta, Finland), Volume I, pp. 533-537, June 9-11 1997.
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Papers (contributor)
R.S. Farr, A. Luque, M.J. Izzard and M. van Ginkel
Liquid phase sintering of two roughened ice crystals in sucrose solution:
A comparison to theory and simulation
Computational Materials Science, in press
A. Heuer, A.R. Cox, S. Singleton, M. Barigou and M. van Ginkel
Visualisation of foam microstructure when subject to pressure change
Colloids and Surfaces A: Physicochemical Engineering Aspects,
311(?):112-123, 2007
J. van de Weijer, L.J. van Vliet, P.W. Verbeek and M. van Ginkel
Curvature estimation in oriented patterns using curvilinear models
applied to gradient vector fields
IEEE transactions on Pattern Analysis and Machine Intelligence,
23(9):1035-1042, 2001.
Technical reports
C.L. Luengo Hendriks, M. van Ginkel and L.J. van Vliet
Underestimation of the Radius in the Radon Transform
for Circles and Spheres
Technical report PH-2003-02, Pattern Recognition Group, Delft University
of Technology, 2003.
This was written in support of the 2005 Pattern Recognition paper.
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